大拱桥--暨南大学学生门户 » 图书馆 » 参数及测量 » ARPA/NBS workshop IV : surface analysis for silicon devices
名称 ARPA/NBS workshop IV : surface analysis for silicon devices
索引号 TN345/E801
分类号 TN345
TN345(参数及测量)
TN34(晶闸管（可控硅）)
TN3(半导体技术)
TN(无线电电子学、电信技术)
T(工业技术)
作者
出版社 U.S. Department of Co. Washington : U.S. Dept. of Commerce, National Bureau of Standards ; [for sale by the Supt. of Docs., Govt. Print. Off.], 1976.
ISBN
页数 vii, 239 p. : ill. ; 27 cm.
价格
标签
简介
注解 "Contains the proceedings of the ARPA/NBS workshop IV, Surface analysis for silicon devices, held at the National Bureau of Standards on April 23-24, 1975." 附註 Includes bibliographical references and index.