大拱桥--暨南大学学生门户 » 图书馆 » 材料 » Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985
名称 Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985
索引号 TN304-53/E901/1985
分类号 TN304-53/E901
TN304(材料)
TN30(一般性问题)
TN3(半导体技术)
TN(无线电电子学、电信技术)
T(工业技术)
作者 International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、
出版社 Amsterdam ; New York : Elsevier, 1985.
ISBN
页数 xii, 306 p. : ill. ; 25 cm.
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