 |
0 索取号:TP216-53/E901/1985 作者:IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、 出版社:New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.
|  |
0 索取号:TP216-53/E901/1983 作者:Autotestcon '83 (1983 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、 出版社:New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, c1983.
|