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0 索取号:O24-53/E803/5 作者:ACM Symposium on Theory of Computing (5th : 1973 : Austin、 Tex.)、ACM Special Interest Group for Automata and Computability Theory.、ACM Digital Library.、 出版社:New York : Association for Computing Machinery, 1973.
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0 索取号:O24-53/E803/3 作者:ACM Symposium on Theory of Computing (3rd : 1971 : Shaker Heights、 Ohio)、ACM Special Interest Group for Automata and Computability Theory.、ACM Digital Library.、 出版社:New York : ACM, Special Interest Group for Automata and Computability Theory, 1971.
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0 索取号:TP274.23-53/E802/1972 作者:ACM SIGFIDET Workshop (1972 : Denver、 Colo.)、Dean、 A. L. (Albert L.)、Association for Computing Machinery. Special Interest Group on File Description and Translation.、 出版社:New York : Association for Computing Machinery, c1972.
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0 索取号:TP273-53/E908/1980 作者:Colloquium on Application of Functional Analysis to Control Theory (1980)、Institution of Electrical Engineers. Professional Group C1.、 出版社:London : IEE, 1980.
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0 索取号:TP14-53/E9018/2 作者:International Conference on Information Systems (2nd : 1981 : Cambridge、 Mass.)、Ross、 Catherine A.、Association for Computing Machinery. Special Interest Group on Business Data Processing.、Institute of Management Sciences. College on Information Systems.、Society for Management Information Systems (U.S.). Research and Education in Information Systems.、 出版社:[S.l. : SMIS, 1981]
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0 索取号:TP11-53/E9023 作者:ACM IEEE Design Automation Conference.、Association for Computing Machinery.、Institute of Electrical and Electronics Engineers.、ACM Special Interest Group on Design Automation.、IEEE Computer Society. Design Automation Technical Committee.、Electronic Design Automation Companies.、 出版社:New York, NY : Institute of Electrical and Electronics Engineers, -1992.
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0 索取号:TN911.17-53/E801 作者:Colloquium on Random Signal Analysis (1977 : London、 England)、Institution of Electrical Engineers. Professional Group E1 (Electronic Measuring Instruments and Techniques)、 出版社:London : IEE, c1977.
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0 索取号:TN4-62/E804 作者:Texas Instruments Incorporated. Semiconductor Group.、 出版社:Dallas : Texas Instruments, c1976.
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0 索取号:TN4/E704/2 作者:Symposium on Hybrid Microelectronics (2nd : 1967 : Boston、 Mass.)、Woulbroun、 John M.、 1932-、Doyle、 George A.、IEEE Parts、 Materials、 and Packaging Group. Boston Chapter.、International Society for Hybrid Microelectronics.、 出版社:[Palo Alto] : International Society for Hybrid Microelectronics; [obtained from Western Periodicals Co., North Hollywood, Calif., 1967].
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0 索取号:TN402-53/E902/1986 作者:IEEE International Conference on Computer-Aided Design (1986 : Santa Clara、 Calif.)、IEEE Computer Society.、IEEE Circuits and Systems Society.、IEEE Electron Devices Society.、ACM Special Interest Group on Design Automation.、 出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
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0 索取号:TN202-62/E801.2 作者:Texas Instruments Incorporated. Semiconductor Group.、 出版社:Dallas, Tex. : Texas Instruments, 1975.
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0 索取号:TN153-53/E803/1977 作者: 出版社:Bristol : Institute of Physics, 1977.
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0 索取号:TN141-53/E801/1974 作者:Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、 出版社:[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.
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0 索取号:TN14-53/E801/11 作者:Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、 出版社:San Francisco, Calif. : San Francisco Press, c1971.
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0 索取号:TN102-53/E801/11 作者:Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、 出版社:New York, N.Y. : IEEE, c1973.
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0 索取号:TN06-53/E801/11 作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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