大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 physics-electrodynamics 的图书(共1677本)

Mathematical methods in physics and engineering with Mathematica

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索取号：O411.1/E20044
作者：Cap、 Ferdinand.、
出版社：Boca Raton : Chapman & Hall/CRC, c2003.

SACRD : a data base for fast reactor safety computer codes

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索取号：TP33/E8014
作者：Oak Ridge National Laboratory. Engineering Physics Division.、Greene、 N. M.、Union Carbide Corporation. Computer Sciences Division.、
出版社：Oak Ridge, Tenn. : Dept. of Energy, Oak Ridge National Laboratory ; [Springfield, Va. : for sale by the National Technical Information Service], 1979.

Semiconductor optoelectronic devices : introduction to physics and simulation

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索取号：TN15/E20042
作者：Piprek、 Joachim.、
出版社：Amsterdam ; Boston : Academic Press, c2003.

Advances in chemical physics. Volume 126

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索取号：O64/E906/126
作者：
出版社：New York : Wiley , 2003.

Proceedings of the Annual Washington Ada Symposium : Ada in the mainstream : applications and education : March 24-26, 1985, The Johns Hopkins Applied Physics Laboratory, Laurel, Maryland

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索取号：TP11-53/E908
作者：Washington Ada Symposium (2nd : 1985 : Laurel、 Md.)、Johnson、 Joseph P.、SIGAda.、Association for Computing Machinery. Washington、 D.C. Chapter.、Applied Physics Laboratory Computer Society (Johns Hopkins University)、ACM Digital Library.、
出版社：New York, N.Y. : Association for Computing Machinery, c1985

Proceedings of the ninth International Conference on Amorphous and Liquid Semiconductors, Grenoble, France, July 2nd-8th, 1981

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索取号：TN304.83/E801/9.2
作者：International Conference on Amorphous and Liquid Semiconductors (9th : 1981 : Grenoble、 France)、Chakraverty、 B. K.、Kaplan、 D.、International Union of Pure and Applied Physics.、
出版社：[Paris] : Éditions de physique, 1981.

Proceedings of the ninth International Conference on Amorphous and Liquid Semiconductors, Grenoble, France, July 2nd-8th, 1981

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索取号：TN304.83/E801/9.1
作者：International Conference on Amorphous and Liquid Semiconductors (9th : 1981 : Grenoble、 France)、Chakraverty、 B. K.、Kaplan、 D.、International Union of Pure and Applied Physics.、
出版社：[Paris] : Éditions de physique, 1981.

Gallium arsenide: proceedings of the international symposium organized by the Institute of Physics and the Physical Society in co-operation with the Avionics Laboratory of the U.S. Air Force, Reading, September 1966

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索取号：TN304.23-53/E701/1966
作者：
出版社：London : Institute of Physics & the Physical Society, 1967].

Proceedings of the conference on electro-optic systems in flow measurement : University of Southampton, 25th -26th September, 1972

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索取号：TN209-53/E801/1972
作者：Conference on Electro-optic Systems in Flow Measurement (1972 : Southampton)、The Departments of Electronics and Mathematics.、Institute of Physics.、
出版社：Southampton : University of Southampton, 1972.

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77)

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索取号：TN153-53/E803/1977
作者：
出版社：Bristol : Institute of Physics, 1977.

Introduction to physics for scientists and engineers

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索取号：TB13-43/E701.4
作者：Bueche、 F. (Frederick)、 1923-、
出版社：New York : McGraw-Hill, c1986.

Advanced physics for Hong Kong. v. 1. Materials and mechanics

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索取号：O4/E20031/1
作者：Duncan、 Tom.、
出版社：London : John Murray, 1992

GCSE physics

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索取号：O4/E908.2
作者：Duncan、 Tom、 1922-、
出版社：London : Murray, 1987.

Calculations for A-level physics

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索取号：O1/E20031.2
作者：Lowe、 T. L.、Rounce、 John.、
出版社：Cheltenham : Thornes, 1992.

Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973

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索取号：TN06-53/E801/11
作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.

Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972

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索取号：TN06-53/E801/10
作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.