大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 reliability 的图书(共160本)

Total Systems Reliability Symposium : December 12-14, 1983, National Bureau of Standards, Gaithersburg, MD

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索取号：TP302-53/E906/1983
作者：Total Systems Reliability Symposium (1983 : National Bureau of Standards)、IEEE Computer Society.、Institute of Electrical and Electronics Engineers.、
出版社：Silver Spring, MD : IEEE Computer Society Press, 1983.

Mathematical models for the study of the reliability of systems

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索取号：TP302/E808
作者：Kaufmann、 A. (Arnold)、 1911-、Grouchko、 Daniel、 joint author.、Cruon、 R.、 joint author.、
出版社：New York : Academic Press, 1977.

Computer systems reliability

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索取号：TP3/E8017
作者：Bunyan、C.J.、Bunyan、 C. J.、Infotech.、
出版社：Maidenhead : Berkshire Infotech Information Ltd., 1974.

Accuracy and reliability in scientific computing

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索取号：TP3/E20061
作者：
出版社：Philadelphia : Society for Industrial and Applied Mathematics, c2005.

Mechatronic reliability : electric failures, mechanical-electrical coupling, domain switching, mass-flow instabilities

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索取号：TH16/E20051
作者：Yang、 Wei、 1954-、
出版社：Berlin ; New York : Springer, 2002.

Software reliability engineering = 软件可靠性工程

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索取号：TP311.5/E20041
作者：Musa、 John D.、
出版社：北京 : China Machine Press, 2003.

Structural reliability : analysis and prediction

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索取号：TU312/E902
作者：Melchers、 R.E. (Robert E.)、 1945-、
出版社：Chichester, W. Sussex, England : Ellis Horwood ; New York : Wiley, [1987]

Motorola memory data manual : quality, reliability, technology

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索取号：TP333-62/E902
作者：Motorola Inc.、
出版社：Austin, Tex. : Motorola, c1982.

Record 1973 IEEE Symposium on Computer Software Reliability : New York City, April 30 through May 2, 1973

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索取号：TP332-53/E801/1973
作者：IEEE Symposium on Computer Software Reliability (1973 : New York City)、Institute for Electrical and Electronic Engineers.、
出版社：New York : IEEE, c1973.

Computer system reliability

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索取号：TP301/E907
作者：Longbottom、 Roy.、
出版社：Chichester, [Eng.] ; New York : Wiley, c1980.

Hybrid microcircuit reliability data

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索取号：TN406/E801
作者：IIT Research Institute.、Reliability Analysis Center (U.S.)、
出版社：Oxford ; New York : Pergamon Press, 1975, c 1976.

1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970

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索取号：TN06-53/E802/1970
作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、
出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.

Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973

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索取号：TN06-53/E801/11
作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.

Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972

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索取号：TN06-53/E801/10
作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.

Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971

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索取号：TN06-53/E801/9
作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.

Biomaterials in the design and reliability of medical devices

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索取号：R318.08/E20041
作者：
出版社：Georgetown, Tex. : Landes Bioscience/Eurekah.com ; New York : Kluwer Academic/Plenum Publishers, c2003.