大拱桥--暨南大学学生门户 » 图书馆 » X射线分析-分析(分类号：TG115.22)(共3本)

Advances in x-ray analysis : proceedings of the ... annual Conference on Application of X-ray Analysis

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索取号：TG115.22/E701
作者：Conference on Application of X-ray Analysis.、Denver Research Institute.、
出版社：New York : Plenum Press, 1960-c1997.

Powder diffraction file

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索取号：TG115.221.5-62/E701
作者：
出版社：Swarthmore, Pa. : The Committee, c1960-

Powder diffraction file search manual for common phases : inorganic and organic, alphabetical, Hanawalt, Fink, 1981

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索取号：TG115.221.5-62/E903
作者：
出版社：Swarthmore, Pa. : The Centre, 1981.