大拱桥--暨南大学学生门户 » 图书馆 » 电子技术(分类号：TM)(共2074本)

分类依据：机电一体化入TH-39。依总论复分表分。

Solar cells

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索取号：TM914.4/E801
作者：
出版社：New York : IEEE Press, 1976.

Solar cell device physics

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索取号：TM914.4/E901
作者：Fonash、 S. J.、
出版社：New York : Academic Press, 1981.

Proceedings of the Symposium on Materials and New Processing Technologies for Photovoltaics

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索取号：TM914.4-53/E901/2
作者：Symposium on Materials and New Processing Technologies for Photovoltaics (2nd : 1980 : Hollywood、 Fla.)、Amick、 James A.、Electrochemical Society. Dielectrics and Insulation Division.、
出版社：Pennington, NJ (10 S. Main St., Pennington 08534) : Electrochemical Society, c1981.

Electrical safety engineering

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索取号：TM92/E801
作者：Cooper、 W. Fordham (William Fordham)、
出版社：London ; Boston : Newnes-Butterworths, 1978.

Electricity and electronics for agriculture

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索取号：TM926/E801
作者：Butchbaker、 A. F.、
出版社：Ames : Iowa State University, 1977.

Applied electronic instrumentation and measurement

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索取号：TM93/E991
作者：Buchla、 David.、McLachlan、 Wayne.、
出版社：New York : Merrill ; Toronto : Collier Macmillan Canada ; New York : Maxwell Macmillan International Pub. Group, c1992.

Elements of electronic instrumentation and measurement

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索取号：TM93/E803
作者：Carr、 Joseph J.、
出版社：Reston, Va. : Reston Pub. Co., 1979.

Electronic instrumentation and measurement techniques

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索取号：TM93/E804.2
作者：Cooper、 William David.、
出版社：Englewood Cliffs, N.J. : Prentice-Hall, 1978.

Electronic systems and instrumentation

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索取号：TM93/E802
作者：Henry、 Richard W. (Richard Warfield)、 1932-、
出版社：New York : Wiley, 1978.

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

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索取号：TM93-53/E902/11
作者：Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982

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索取号：TM93-53/E901/1982
作者：International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、
出版社：Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983

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索取号：TM93-53/E901/1983
作者：International Test Conference (14th : 1983 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社：Silver Spring, MD : IEEE Computer Society Press, 1983.

Electronic design of microprocessor-based instruments and control systems

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索取号：TM930.9/E901
作者：Wist、 Abund Ottokar.、Meiksin、 Z. H.、
出版社：New York Englewood Cliffs, N.J. : Prentice-Hall, Business and Professional Division, 1986.

Modern microwave measurements and techniques

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索取号：TM931/E901
作者：Laverghetta、 Thomas S.、
出版社：Norwood, MA : Artech House, 1988.

Complete guide to digital test equipment

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索取号：TM932/E801
作者：Buchsbaum、 Walter H.、
出版社：Englewood Cliffs, N.J. : Prentice-Hall, 1977.

Computer-assisted network and system analysis

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索取号：TM13/E905
作者：Mastascusa、 E. J.、
出版社：New York : Wiley, 1988.