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Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

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索取号：TM93-53/E902/11
作者：Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.