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0
索取号：TN06-53/E802/1970
作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、
出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.
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0
索取号：TN06-53/E801/11
作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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0
索取号：TN06-53/E801/10
作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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0
索取号：TN06-53/E801/9
作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
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0
索取号：TN06/E902
作者：Klaassen、 Klaas B.、 1941-、
出版社：Amsterdam ; New York : Elsevier ; New York, N.Y. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1984.
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0
索取号：TN06/E901
作者：Tobias、 Paul A.、Trindade、 David C.、
出版社：New York : Van Nostrand Reinhold, 1986.
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0
索取号：TN06/20071
作者：莫瑞达、佐瑞达、张威、王仲、
出版社：北京 : 机械工业出版社, 2007
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0
索取号：TN06/20061
作者：李玲远、范绿蓉、陈小宇、
出版社：北京 : 科学出版社, 2005
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0
索取号：TN06/911
作者：卢昆祥、
出版社：天津 : 天津科学技术出版社, 1987.12
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