大拱桥--暨南大学学生门户 » 图书馆 » 真空电子技术(分类号：TN1)(共215本)

Electronic design data book

0
索取号：TN102-62/E801
作者：Graf、 Rudolf F.、
出版社：New York, Van Nostrand Reinhold Co. [1971]

Rational fault analysis

0
索取号：TN106/E802
作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、
出版社：New York : M. Dekker, 1977.

Electronic measurements and instrumentation

0
索取号：TN107/E801
作者：Oliver、 Bernard M.、 1916-、Cage、 John M.、 joint author.、
出版社：New York, McGraw-Hill [1971]

Electronic devices and circuits

0
索取号：TN11/E901.2
作者：Bell、 David A.、 1930-、
出版社：Reston, Va. : Reston Pub. Co., 1980.

Solid state electronic devices

0
索取号：TN11/E801
作者：Streetman、 Ben G.、
出版社：Englewood Cliffs, N.J. : Prentice-Hall, [1972]

Glow discharge processes : sputtering and plasma etching

0
索取号：TN131/E901
作者：Chapman、 Brian N.、
出版社：New York : Wiley, 1980.

Video and digital electronic displays : a user's guide

0
索取号：TN141-62/E901
作者：Sherr、 Sol.、
出版社：New York : Wiley, 1982.

Optoelectronic devices and principles

0
索取号：TN15/E991
作者：Mooney、 William J.、 1941-、
出版社：Englewood Cliffs, N.J. : Prentice Hall, c1991.

Advanced scanning electron microscopy and X-ray microanalysis

0
索取号：TN153/E901
作者：
出版社：New York : Plenum Press, 1986.

The chemical applications of transmission electron microscopy

0
索取号：TN153/E802
作者：Fryer、 J. R.、
出版社：London ; New York : Academic Press, 1979.

Quantitative scanning electron microscopy

0
索取号：TN153/E801
作者：
出版社：London ; New York : Academic Press, 1974.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

0
索取号：TN153-53/E804/1974
作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社：Chicago Ill. : IIT Research Institute, 1973.

Practical troubleshooting with the modern oscilloscope

0
索取号：TN141.1/E801
作者：Goodman、 Robert L.、
出版社：Blue Ridge Summit, Pa. : TAB Books, 1979.

Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

0
索取号：TN153-53/E801/10.3
作者：International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社：West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.

Filtering in the time and frequency domains

0
索取号：TN173/E801
作者：Blinchikoff、 Herman J.、Zverev、 Anatol I.、 joint author.、
出版社：New York : Wiley, 1976.

Proceedings of MELECON '85, Mediterranean Electrotechnical Conference, Madrid, Spain, October 8, 9, 10, 1985. v. 4

0
索取号：TN1-53/E902/1985.4
作者：Mediterranean Electrotechnical Conference (3rd : 1985 : Madrid、 Spain)、Luque、 A. (Antonio)、Figueiras-Vidal、 A. R. (AńИbal R.)、Delgado、 JośЕ Manuel RodŕИguez、 1915-、
出版社：[New York] : Institute of Electrical and Electronics Engineers ; Amsterdam ; New York : North-Holland ; New York : Distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1985.