大拱桥--暨南大学学生门户 » 图书馆 » 光电器件、光电管(分类号：TN15)(共39本)

新型光电器件与光电辅料应用手册

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索取号：TN15-62/20091
作者：杨帮文、
出版社：北京 : 机械工业出版社, 2008

Field-ion microscopy

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索取号：TN153-5/E701
作者：Hren、 John J.、Ranganathan、 Srinivasa、 1941- joint author.、
出版社：New York : Plenum Press, 1968.

Electron microscopy and cell structure

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索取号：TN153/E803
作者：Tribe、 Michael A.、Eraut、 Michael、 joint author.、Snook、 Roger K.、 joint author.、
出版社：Cambridge [Eng.] ; New York : Cambridge University Press, 1975.

Waveguide nonlinear-optic devices

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索取号：TN15/E20041
作者：Suhara、 Toshiaki、 1950-、Fujimura、 M. (Masatoshi)、 1965-、
出版社：Berlin ; New York : Springer, c2003.

Semiconductor optoelectronic devices : introduction to physics and simulation

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索取号：TN15/E20042
作者：Piprek、 Joachim.、
出版社：Amsterdam ; Boston : Academic Press, c2003.

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77)

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索取号：TN153-53/E803/1977
作者：
出版社：Bristol : Institute of Physics, 1977.

Scanning electron microscopy, 1972 : IIT research institute Chicago, Illinois 60616 USA

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索取号：TN153-53/E804/1972
作者：Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、
出版社：Chicago, Ill. : IITRI, 1972.

RCA photomultiplier manual : theory, design, application

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索取号：TN152-62/E801
作者：Radio Corperation of America.、
出版社：Harrison, N.J. : RCA Electronic Components, c1970.

Proceedings : thirty-first annual meeting electron microscopy society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973

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索取号：TN153-53/E802/31
作者：Electron Microscopy Society of America.、Arceneaux、 Claude J.、Meeting Electron Microscopy Society of America.、
出版社：Baton Rouge : Claitor's Publishing Division, 1973.

Photonics essentials

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索取号：TN15/E20031
作者：Pearsall、 T. P.、
出版社：New York : McGraw-Hill, c2003.

Optoelectronic devices and principles

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索取号：TN15/E991
作者：Mooney、 William J.、 1941-、
出版社：Englewood Cliffs, N.J. : Prentice Hall, c1991.

Advanced scanning electron microscopy and X-ray microanalysis

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索取号：TN153/E901
作者：
出版社：New York : Plenum Press, 1986.

The chemical applications of transmission electron microscopy

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索取号：TN153/E802
作者：Fryer、 J. R.、
出版社：London ; New York : Academic Press, 1979.

Quantitative scanning electron microscopy

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索取号：TN153/E801
作者：
出版社：London ; New York : Academic Press, 1974.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

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索取号：TN153-53/E804/1974
作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社：Chicago Ill. : IIT Research Institute, 1973.

Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号：TN153-53/E801/10.3
作者：International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社：West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.