大拱桥--暨南大学学生门户 » 图书馆 » (分类号：TN153)(共15本)

走査電子顕微鏡 : 基礎と応用

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索取号：TN153/J901
作者：日本電子顕微鏡学会関東支部、
出版社：東京 : 共立出版, 1976.7

Scanning electron microscopy : a review of the first two years' work using the cambridge 'stereoscan' microscope

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索取号：TN153/E804
作者：Head、 k.、Plaw、 Jean M.、
出版社：[s.l. : s.n.], 1970.

Field-ion microscopy

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索取号：TN153-5/E701
作者：Hren、 John J.、Ranganathan、 Srinivasa、 1941- joint author.、
出版社：New York : Plenum Press, 1968.

Electron microscopy and cell structure

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索取号：TN153/E803
作者：Tribe、 Michael A.、Eraut、 Michael、 joint author.、Snook、 Roger K.、 joint author.、
出版社：Cambridge [Eng.] ; New York : Cambridge University Press, 1975.

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77)

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索取号：TN153-53/E803/1977
作者：
出版社：Bristol : Institute of Physics, 1977.

Scanning electron microscopy, 1972 : IIT research institute Chicago, Illinois 60616 USA

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索取号：TN153-53/E804/1972
作者：Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、
出版社：Chicago, Ill. : IITRI, 1972.

Proceedings : thirty-first annual meeting electron microscopy society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973

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索取号：TN153-53/E802/31
作者：Electron Microscopy Society of America.、Arceneaux、 Claude J.、Meeting Electron Microscopy Society of America.、
出版社：Baton Rouge : Claitor's Publishing Division, 1973.

Advanced scanning electron microscopy and X-ray microanalysis

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索取号：TN153/E901
作者：
出版社：New York : Plenum Press, 1986.

The chemical applications of transmission electron microscopy

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索取号：TN153/E802
作者：Fryer、 J. R.、
出版社：London ; New York : Academic Press, 1979.

Quantitative scanning electron microscopy

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索取号：TN153/E801
作者：
出版社：London ; New York : Academic Press, 1974.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

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索取号：TN153-53/E804/1974
作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社：Chicago Ill. : IIT Research Institute, 1973.

Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号：TN153-53/E801/10.3
作者：International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社：West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.

Electron microscopy 1978 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号：TN153-53/E801/9.3
作者：International Congress on Electron Microscopy (9th : 1978 : Toronto、 Ont.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社：Toronto : Microscopical Society of Canada, c1978.

Electron microscopy 1978 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号：TN153-53/E801/9.1
作者：International Congress on Electron Microscopy (9th : 1978 : Toronto、 Ont.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社：Toronto : Microscopical Society of Canada, c1978.

Electron microscopy 1974 : abstracts of papers presented to the Eighth International Congress on Electron Microscopy, held in Canberra, Australia, August 25-31, 1974

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索取号：TN153-53/E801/8.2
作者：International Congress on Electron Microscopy (8th : 1974 : Canberra、 A.C.T.)、Sanders、 J. V.、Goodchild、 D. J.、
出版社：Canberra : Australian Academy of Science, [1974?]