大拱桥--暨南大学学生门户 » 图书馆 » (分类号:TN153-53/E804)(共2本)
Scanning electron microscopy, 1972 : IIT research institute Chicago, Illinois 60616 USA0索取号:TN153-53/E804/1972 作者:Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、 出版社:Chicago, Ill. : IITRI, 1972. | Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope0索取号:TN153-53/E804/1974 作者:Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、 出版社:Chicago Ill. : IIT Research Institute, 1973. |










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