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Automated testing for electronics manufacturing : ATE Seminar/Exhibit, January 30-February 1, 1978, L. A. Marriott, Los Angeles, CA : proceedings

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索取号：TP216-53/E801/1978
作者：ATE Seminar、 2d、 Los Angeles、 1978.、Circuits manufacturing.、
出版社：[s.l.] : Benwill Pub. Corp., c1978.

Automated testing for electronics manufacturing, March 21-23, 1977 ... Cambridge, MA. : proceedings, ATE Seminar and exhibit

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索取号：TP216-53/E801/1977
作者：ATE Seminar、 Cambridge、 Mass.、 1977.、
出版社：[s.l.] : Benwill Pub. Corp., c1977.