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Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979

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索取号：O64-51/E8022
作者：International Conference on Secondary Ion Mass Spectrometry (2nd : 1979 : Stanford University).、Benninghoven、 A.、
出版社：New York : Springer-Verlag, 1979.