大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 j-test 的图书(共311本)

Test item file 1, management, seventh edition, Stephen P. Robbins, Mary Coulter

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索取号：C93-44/E20051
作者：Yap、 Andrew P.、Robbins、 Stephen P.、 1943- Management. 7th ed.、Coulter、 Mary K.、
出版社：Upper Saddle River, N.J. : Prentice Hall, c2002.

Test item file, Decision modeling with microsoft exel, sixth edition, Jeffrey H.Moore, Larry R.Weatherford

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索取号：F224.0/E20053
作者：Swearingen、 John.、Moore、 Jeffrey H. (Jeffrey Hillsman). Decision modeling with microsoft excel. 6th ed.、Weatherford、 Lawrence R.、
出版社：Upper Saddle River, N.J. : Pearson Education, c2001.

Test item file, Modern database management, sixth edition, Jeffrey A. Hoffer, Mary B. Prescott, Fred R. McFadden

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索取号：TP311.131-44/E20051
作者：Russo、 John P.、Hoffer、 Jeffrey A. Modern database management. 6th ed.、Prescott、 Mary B.、McFadden、 Fred R.、 1933-、
出版社：Upper Saddle River, NJ : Prentice Hall, c2002.

Instructor's manual with test item file, Managing behavior in organizations, third edition, Jerald Greenberg

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索取号：C936/E20052
作者：McMasters、 Rosemary.、Greenberg、 Jerald. Managing behavior in organizations. 3rd ed.、
出版社：Upper Saddle River, N.J. : Pearson Education, c2002.

Test-driven development : a practical guide = 测试驱动开发 : 实用指南

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索取号：TP311.5/E200410
作者：Astels、 David.、Jeffries、 Ron、 1939-、
出版社：北京 : 中国电力出版社, 2004.

Test-driven development : a J2EE example

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索取号：TP311.5/E20053
作者：Hammell、 Thomas.、Gold、 Russell.、Snyder、 Tom.、
出版社：Berkeley, CA : Apress, c2005.

Design-for-test for digital IC's and embedded core systems = 数字集成电路与嵌入式内核系统可测试性设计

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索取号：TN431.2/E20043
作者：Crouch、 Alfred L.、
出版社：北京 : 中国电力出版社, 2004.

How to prepare for the test of English as a foreign language

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索取号：H319.3/E907
作者：Murphy、 Andrew F.、
出版社：San Diego : Books for Professionals , c1981.

How to prepare for the GMAT : Graduate management admission test

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索取号：H319.3/E903.2
作者：Newhouse、 Bertha S.、
出版社：[s. l. : s.n., n.d.]

Design and test of integrated inductors for RF applications

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索取号：TN4/E20042
作者：Aguilera、 Jaime.、Berenguer、 Roc.、
出版社：Boston : Kluwer Academic Publishers, c2003.

Toefl : test of English as a foreign language = 托福捷径

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索取号：H319.3/E9020
作者：
出版社：H. K. : The A and H Printing Co., 1986.

The statistical implications of pre-test and Stein-rule estimators in econometrics

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索取号：F224/E809
作者：Judge、 George G.、Bock、 M. E. (Mary Ellen)、
出版社：Amsterdam ; New York : North-Holland Pub. Co. ; New York : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.

Teach and test

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索取号：H319.4/E80204
作者：Etherton、 A. R. B.、
出版社：Hong Kong : Summerson Eastern Pubushers Ltd., 1977-80.

Digest of papers : testing to integrate semiconductor memories into computer mainframes

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索取号：TP333.15/E802
作者：Semiconductor Memory Test Symposium (1972 : Cherry Hill、 N.J.)、IEEE Computer Society. Mideastern Area Committee.、Institute for Electrical and Electronics Engineers. Philadelphia Chapter.、
出版社：New York : Institute of Electrical and Electronics Engineers, c1973.

Digest of papers : 1977 Semictonductor Test Symposium, Memory and LSI. Oct. 25-27, 1977, held at Cherry Hill, N. J.

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索取号：TN304.07-53/E801/1977
作者：Symposium on Semiconductor Memory Testing (1977 : Cherry Hill、 N.J.)、IEEE Computer Society. Mideastern Area Committee.、IEEE Computer Society. Philadelphia Chapter.、
出版社：New York : Institute of Electrical and Electronics Engineers, c1977.

Longman complete course for the TOEFL test : preparation for the computer and paper tests = 朗文托福考试完全培训教程

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索取号：H310.41/E20032
作者：Phillips、 Deborah、 1952-、
出版社：北京 : 中国水利水电出版社, 2002.