大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 j-test 的图书(共311本)

Longman introductory course for the TOEFL test = 最新朗文托福考试指南

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索取号：H310.41/E20031.2
作者：Phillips、 Deborah、 1952-、
出版社：天津 : 南开大学出版社, 2003.

Test Item File,chemistry = the central science

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索取号：O6/E20034.9
作者：Richter、 Helen.、Cook、 Elzbieta.、
出版社：Upper Saddle River,NJ: Prentice Hall, 2003.

Chemistry : an introduction for medical students, including 902 test questions

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索取号：R313/E808
作者：Beyermann、 Klaus、 1929-、
出版社：Stuttgart : Thieme, 1975.

MCSE test success. Internet Information Server 4

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索取号：TP393.4/E991
作者：Donald、 Lisa.、
出版社：Beijing : Publishing House of Electronics Industry, 1999.

MCSE test success : Windows 98

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索取号：TP316.7/E991
作者：
出版社：Beijig : Publishing House of Electronics Industry 1999

Interpreting ECGs : an advanced self-test guide

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索取号：R540.4/E9010
作者：Haddad、 Ali、 1943-、Dean、 David C.、
出版社：Oradell, N.J. : Medical Economics Co., Book Division, 1981.

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

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索取号：TM93-53/E902/11
作者：Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982

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索取号：TM93-53/E901/1982
作者：International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、
出版社：Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983

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索取号：TM93-53/E901/1983
作者：International Test Conference (14th : 1983 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社：Silver Spring, MD : IEEE Computer Society Press, 1983.

Complete guide to digital test equipment

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索取号：TM932/E801
作者：Buchsbaum、 Walter H.、
出版社：Englewood Cliffs, N.J. : Prentice-Hall, 1977.

Modern electronic test equipment

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索取号：TM93/E902
作者：Brindley、 Keith.、
出版社：London : Heinemann, 1986.

Electronic test equipment : operation and applications

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索取号：TM93/E901
作者：
出版社：London ; New York : Granada ; [Brookfield, Vt. : Distributed by Renouf USA], 1981.

Assessment of immune status by the leukocyte adherence inhibition test

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索取号：R730.3/E9010
作者：
出版社：New York : Academic Press, 1982.

Test your understanding of neurophysiology

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索取号：R338/E904
作者：Murray、 R. W. (Richard Wycliffe)、 1925-、
出版社：Cambridge [Cambridgeshire] ; New York : Cambridge University Press, 1983.

Spot test analysis : clinical, environmental, forensic, and geochemical applications

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索取号：O655.2/E901
作者：Jungreis、 Ervin、 1926-、
出版社：New York : Wiley, c1985.

Test tube babies : in vitro fertilization and embryo transfer

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索取号：R321/E901
作者：Tyckoson、 David A.、
出版社：Phoenix, Ariz. : Oryx Press, 1986.