大拱桥--暨南大学学生门户 » 图书馆 » 参数测试与检验 » Lsi & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey
名称 Lsi & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey
索引号 TN304.07-53/E801/1978
分类号 TN304.07-53/E801
TN304.07(参数测试与检验)
TN304.0(一般性问题)
TN304(材料)
TN30(一般性问题)
TN3(半导体技术)
TN(无线电电子学、电信技术)
T(工业技术)
作者 Semiconductor Test Conference (1978 : Cherry Hill、 Township、 N.J.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社 New York : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1978.
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页数 ii, 301 p. : ill. ; 28 cm.
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