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Defects in silicon : proceedings of Symposium B on Science and Technology of Defects in Silicon of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989

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索取号：TN304.1-53/E901/1989
作者：Symposium B on Science and Technology of Defects in Silicon (1989 : Strasbourg、 France)、Ammerlaan、 C. A. J. (Cornelis Antonius Josephus)、Chantre、 A.、Wagner、 P.、European Materials Research Society. Meeting (1989 : Strasbourg、 France)、
出版社：Amsterdam ; New York : North-Holland ; New York, NY, USA : Sole distributors for the USA and Canada, Elsevier Science Pub. Co., 1989.