大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 it.test 的图书(共311本)

High Quality Test Pattern Generation and Boolean Satisfiability [electronic resource]

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作者：Eggersgl眉脽、 Stephan.、Drechsler、 Rolf.、SpringerLink (Online service)、
出版社：Boston, MA : Springer US, 2012.

Built-in-Self-Test and Digital Self-Calibration for RF SoCs [electronic resource]

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作者：Bou-Sleiman、 Sleiman.、Ismail、 Mohammed.、SpringerLink (Online service)、
出版社：New York, NY : Springer New York, 2012.

Microelectronic Test Structures for CMOS Technology [electronic resource]

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作者：Bhushan、 Manjul.、Ketchen、 Mark B.、SpringerLink (Online service)、
出版社：New York, NY : Springer New York : Imprint: Springer, 2011.

Test and Diagnosis for Small-Delay Defects [electronic resource]

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作者：Tehranipoor、 Mohammad.、Peng、 Ke.、Chakrabarty、 Krishnendu.、SpringerLink (Online service)、
出版社：New York, NY : Springer New York, 2012.

Digital System Test and Testable Design [electronic resource] : Using HDL Models and Architectures

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作者：Navabi、 Zainalabedin.、SpringerLink (Online service)、
出版社：Boston, MA : Springer US : Imprint: Springer, 2011.

Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

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作者：Bosio、 Alberto.、Dilillo、 Luigi.、Girard、 Patrick.、Pravossoudovitch、 Serge.、Virazel、 Arnaud.、SpringerLink (Online service)、
出版社：Boston, MA : Springer US, 2010.

Power-Aware Testing and Test Strategies for Low Power Devices [electronic resource]

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作者：Girard、 Patrick.、Nicolici、 Nicola.、Wen、 Xiaoqing.、SpringerLink (Online service)、
出版社：Boston, MA : Springer US, 2010.

Design Driven Testing [electronic resource] : Test Smarter, Not Harder

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作者：Stephens、 Matt.、Rosenberg、 Doug.、SpringerLink (Online service)、
出版社：Berkeley, CA : Apress, 2010.

.NET Test Automation Recipes [electronic resource] : A Problem-Solution Approach

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作者：McCaffrey、 James D.、SpringerLink (Online service)、
出版社：Berkeley, CA : Apress, 2006.

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test

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作者：Pavlov、 Andrei.、Sachdev、 Manoj.、SpringerLink (Online service)、
出版社：Dordrecht : Springer Netherlands, 2008.

Nuclear Test Ban [electronic resource] : Converting Political Visions to Reality

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作者：Haak、 Hein.、Mykkeltveit、 S.、Dahlman、 Ola.、SpringerLink (Online service)、
出版社：Dordrecht : Springer Netherlands, 2009.

Parsing the Turing Test [electronic resource] : Philosophical and Methodological Issues in the Quest for the Thinking Computer

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作者：Epstein、 Robert.、Roberts、 Gary.、Beber、 Grace.、SpringerLink (Online service)、
出版社：Dordrecht : Springer Netherlands, 2009.

Design, Automation, and Test in Europe [electronic resource] : The Most Influential Papers of 10 Years Date

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作者：Lauwereins、 Rudy.、Madsen、 Jan.、SpringerLink (Online service)、
出版社：Dordrecht : Springer Netherlands, 2008.

Oscillation-Based Test in Mixed-Signal Circuits [electronic resource]

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作者：S谩nchez、 Gloria Huertas.、Garc铆a de la Vega、 Diego V谩zquez.、Rueda、 Adoraci贸n Rueda.、D铆az、 Jos茅 Luis Huertas.、SpringerLink (Online service)、
出版社：Dordrecht : Springer Netherlands, 2006.

Small-scale Freshwater Toxicity Investigations [electronic resource] : Toxicity Test Methods

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作者：Blaise、 Christian.、F茅rard、 Jean-Fran莽ois.、SpringerLink (Online service)、
出版社：Dordrecht : Springer Netherlands, 2005.

Industrial Process Identification and Control Design [electronic resource] : Step-test and Relay-experiment-based Methods

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作者：Liu、 Tao.、Gao、 Furong.、SpringerLink (Online service)、
出版社：London : Springer London : Imprint: Springer, 2012.