大拱桥--暨南大学学生门户 » 图书馆 » 一般性问题(分类号：TN30)(共236本)

Defects in silicon : proceedings of Symposium B on Science and Technology of Defects in Silicon of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989

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索取号：TN304.1-53/E901/1989
作者：Symposium B on Science and Technology of Defects in Silicon (1989 : Strasbourg、 France)、Ammerlaan、 C. A. J. (Cornelis Antonius Josephus)、Chantre、 A.、Wagner、 P.、European Materials Research Society. Meeting (1989 : Strasbourg、 France)、
出版社：Amsterdam ; New York : North-Holland ; New York, NY, USA : Sole distributors for the USA and Canada, Elsevier Science Pub. Co., 1989.

Kirchhoff's laws

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索取号：TN30-49/E807
作者：Koller、 Alois.、
出版社：Berlin : Siemens ; London : Heyden & Son, 1978.

Semiconductor silicon 1973

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索取号：TN304.1-53/E801/2
作者：International Symposium on Silicon Materials Science and Technology (2nd : 1973 : Chicago、 Ill.)、Huff、 Howard R.、Burgess、 Ronald R.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、
出版社：Princeton, N.J. : Electrochemical Society, c1973.

Semiconductor power devices : physics of operation and fabrication technology

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索取号：TN305/E803
作者：Ghandhi、 Sorab Khushro、 1928-、
出版社：New York : Wiley, c1977.

The physics of semiconductor devices

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索取号：TN305.0/E801.3
作者：Fraser、 D. A.、
出版社：Oxford : Clarendon Press ; New York : Oxford University Press, 1983.

Semiconductors and electronic devices

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索取号：TN305/E802
作者：Bar-Lev、 Adir.、
出版社：London ; Englewood Cliffs, N.J. : Prentice/Hall International, c1979.

Semiconductor devices and circuits

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索取号：TN303/E905
作者：Zanger、 Henry、 1931-、
出版社：New York : Wiley, c1984.

Semiconducting devices : a bibliography of fabrication technology, properties, and applications

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索取号：TN30-7/E801
作者：Agajanian、 A. H.、
出版社：New York : IFI/Plenum, c1976.

Lsi & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey

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索取号：TN304.07-53/E801/1978
作者：Semiconductor Test Conference (1978 : Cherry Hill、 Township、 N.J.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社：New York : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1978.

Introduction to the basic principles of semiconductors

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索取号：TN30-49/E806
作者：Benda、 Hansjochen.、
出版社：London : Heyden, 1978.

The electric field

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索取号：TN30-49/E805
作者：Lang、 Johannes G.、
出版社：London : Heyden, 1978.

The magnetic field

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索取号：TN30-49/E804
作者：Lang、 Johannes G.、
出版社：London : Heyden, 1978.

The magnetic circuit

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索取号：TN30-49/E803
作者：Rieger、 Heins.、
出版社：London : Heyden, 1978.

Generator-motor : physical fundamentals and basic mechanical forms

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索取号：TN30-49/E801
作者：Seifert、 Walter.、
出版社：Berlin : Siemens, 1976.

The physics of semiconductor devices

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索取号：TN305.0/E801.2
作者：Fraser、 D.A.、
出版社：Oxford : Clarendon Press, 1979.

Modern MOS technology : processes, devices, and design

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索取号：TN304.2/E902
作者：Ong、 DeWitt G.、
出版社：New York : McGraw-Hill, c1984.